An improvement in XPS peak shape analysis for studying the morphology of gold nanowires intermixed with polymer

Document Type : Full length research Paper

Authors

1 Yasouj University

2 Academic member, Yasouj University

Abstract

We have improved XPS peak shape analysis for accurate characterization of metal nanostructures intermixed with a polymer matrix. We have determined the detailed in depth distribution of cylindrical Au nanowire in polymer matrix by the analysis of a single spectrum by taking into account the electron transport phenomena corresponding to both metal and polymer components. This means that we have made a very simple and nondestructive indirect 3D XPS imaging technique for accurate inline characterization of binary component surface nanostructures including metal and polymer. This is a very promising technique which is suitable for inline quality control of such surface nanostructures.

Keywords

Main Subjects

References

 
[1] K.L. Mittal, [ed.] Metalized plastics: Fundamentals and Applications, Marcel Dekker, New York (1998).
[2] S. Tougaard, Surface nanostructure determination by x-ray photoemission spectroscopy peak shape analysis, Journal of Vacuum Science & Technology A 14 (1996) 1415-1423.
[3] S. Tougaard, Composition depth information from the inelastic background signal in XPS, Surface Science 162 (1985) 875-885.
[4] S. Tougaard, Inelastic background removal in x-ray excited photoelectron spectra from homogeneous and inhomogeneous solids, Journal of Vacuum Science & Technology A 5 (1987) 1230-1234.
[5] S. Tougaard, Quantitative Analysis of the Inelastic Background in Surface Electron Spectroscopy, Surface and Interface Analysis 11 (1988) 453-472.
[6] S. Tougaard, H.S. Hansen, Non-destructive depth profiling through quantitativeanalysis of surface electron spectra, Surface and Interface Analysis 14 (1989) 730-738.
[7] S. Tougaard, Accuracy of the Non-destructive Surface Nanostructure Quantification Technique Based on Analysis of the XPS or AES Peak Shape, Surface and Interface Analysis 26 (1998) 249-269.
[8] S. Tougaard, in: D. Briggs, J.T. Grant, [ed.] Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, Chichester, IM-Publications (2003) 295-343.
[9] S. Tougaard, Quantitative x-ray photoelectron spectroscopy: Simple algorithm to determine the amount of atoms in the outermost few nanometers, Journal of Vacuum Science & Technology A 21 (2003) 1081-1086.
[10]  S. Tougaard, Algorithm for automatic x-ray photoelectron spectroscopy data processing and x-ray photoelectron spectroscopy imaging, Journal of Vacuum Science & Technology A 23 (2005) 741-745.
[11]  S. Tanuma, C.J. Powell, D.R. Penn, Calculations of electron inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV range, Surface and Interface Analysis 17 (1991) 911-926.
[12]  S. Tanuma, C.J. Powell, D.R. Penn, Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range, Surface and Interface Analysis 21 (1994) 165-176.
[13]  S. Hajati, S. Coultas, C. Blomfield, S. Tougaard, XPS imaging of depth profiles and amount of substance based on Tougaard’s algorithm, Surface Science 600 (2006) 3015-3021.
[14]  S. Hajati, S. Tougaard, J. Walton, N. Fairley, Noise reduction procedures applied to XPS imaging of depth distribution of atoms on the nanoscale, Surface Science 602 (2008) 3064-3070.
[15]  S. Hajati, S. Coultas, C. Blomfield, S. Tougaard, Nondestructive quantitative XPS imaging of depth distribution of atoms on the nanoscale, Surface and Interface Analysis 40 (2008) 688-691.
[16]  S. Hajati, S. Tougaard, XPS for non-destructive depth profiling and 3D imaging of surface nanostructures, Anal. Bioanal. Chem 396 (2010) 2741–2755.
[17]  S. Hajati, V. Zaporojtchenko, F. Faupel, S. Tougaard,  Characterization of Au nano-cluster formation on and diffusion in polystyrene using XPS peak shape analysis, Surface Science 601 (2007) 3261-3267.
[18]  D. Briggs, J.T. Grant, in: D. Briggs, J.T. Grant, [ed.] Surface Analysis by Auger and Photoelectron Spectroscopy, IM Publications, Chichester, (2003).
[19]  J.C. Riviere, S. Myhra, [ed.] Handbook of Surface and Interface Analysis: Methods for Problem-solving, 2nd edition, CRC Press, Boca Raton (2009).

Files

History

  • Receive Date: 12 January 2015
  • Revise Date: 17 November 2015
  • Accept Date: 26 January 2016

Share

How to cite

Statistics