Characterization of Nanofilms by Reflection Electron Energy Loss Spectroscopy, SrTiO3 as Case Study

Document Type : Full length research Paper

Authors

1 Academic member, 1Department of Physics, Yasouj University, Yasouj, Iran 2Department of Semiconductors, Materials and Energy Research Center (MERC), Karaj, Iran

2 Department of Physics, Yasouj University, Yasouj, Iran

Abstract

The electronic properties of thin films and nanostructures as well as the surface electronic structure can be obtained using Reflection electron energy loss technique at low energy. In this work, dielectric function of SrTiO3 is obtained by Yubero-Tougaard method using the experimental inelastic cross section obtained by Tougaard-Chorkrndorf method. Theoretical cross section obtained at energy 1423 eV, incidence angle 15 and exit angle 35 was found to be in good consistence with experimental cross section. In addition, the angular distribution of surface excitation parameter for this crystal was determined at energies 1000, 1423, 2000, 2500 and 3000 eV. To this end, the definition presented by Pauly and Tougaard was used which relies on the variation in excitation probability at surface and moving in semi-infinite medium. This parameter was calculated based on the differential inelastic electron dispersion cross section using QUEELS software which is valid for reflection electron energy loss spectrum.

Keywords

References

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Journal of Research on Many-body Systems
Volume 7, Issue 14
December 2017
Pages 69-57

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History

  • Receive Date: 29 February 2016
  • Revise Date: 01 April 2017
  • Accept Date: 01 May 2017

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