بررسی اثرات تخریبی یون های آرگون و هیدروژن تولید شده در دستگاه پلاسمای کانونی بر روی گرافیت

نوع مقاله : مقاله پژوهشی کامل

نویسندگان

1 گروه فیزیک، دانشگاه پیام نور، ص.پ. 3697-19395، تهران، ایران

2 گروه فیزیک، دانشکده علوم پایه، دانشگاه بین المللی امام خمینی، ص.پ. 96818-34148 ، قزوین، ایران

چکیده

اثرات تخریبی تابش یون‌های پر انرژی هیدروژن و آرگون تولید شده در دستگاه پلاسمای کانونی نوع مدر MTPF-2 بر روی خواص سطحی و ساختاری گرافیت بررسی شد. نمونه های خام و تابش دهی شده با استفاده از میکروسکوپ الکترونی روبشی تجزیه و تحلیل شد. در نمونه های تابش دهی شده با یون های هیدروژن، کندو پاش های نقطه ای، خلل و فرج در سطح نمونه ها به همراه ذوب شدگی نقطه ای دیده شد. پدیده غالب در سطح نمونه تابش دهی شده با یون آرگون کندو پاش فیزیکی ذرات از سطح گرافیت است. از تجزیه و تحلیل پراش اشعه ایکس برای بررسی تغییرات ایجاد شده در اثر تابش پروتون‌ها و یون‌های آرگون پر انرژی بر روی ساختار گرافیت استفاده شد. در طیف پراش اشعه ایکس نمونه های تابش دهی شده، جابه جایی در مکان قله‌ها و تغییر شدت قله‌ها نسبت به طیف پراش اشعه ایکس نمونه مرجع مشاهده شد. به طوری که مکان قله‌ها نمونه گرافیت تابش دهی شده با هیدروژن و نمونه تابش دهی شده با آرگون به سمت زوایای کوچکتر جابه جا شده است. میزان جابجایی مکان قله‌ها در نمونه تابش دهی شده با پروتون ها نسبت به جابجایی حاصله بوسیله یون های آرگون بیشتر است.

کلیدواژه‌ها

موضوعات


عنوان مقاله [English]

The Investigation of the Destructive Effects of Hydrogen and Argon Ions produced in The Plasma Focus Device on Graphite

نویسندگان [English]

  • Alieh Chamani 1
  • Seyed Mohammad Mahdi Abtahi 2
1 Department of Physics, Payame Noor University (PNU), P.O. Box: 19395-3697, Tehran, Iran
2 Physics Department, Imam Khomeini International University, Qazvin, Iran
چکیده [English]

The destructive effects of high-energy hydrogen and argon ions irradiated in the MTPF-2 Mather type plasma focus device on the surface and structural properties of graphite were investigated. Raw and irradiated samples were analyzed using a Scanning Electron Microscope. While microscopic images of samples irradiated with hydrogen ions point sputtering, pores are seen on the samples' surface along with spot melts, the predominant phenomenon on the surface of samples irradiated with argon ions is sputtering of particles from the graphite surface. X-ray diffraction analysis was used to investigate the changes caused by the irradiation of high-energy protons and argon ions on the graphite structure. In the X-ray diffraction spectrum of the irradiated samples, the peaks' displacement, and the change in the peaks' intensity compared to the X-ray diffraction spectrum of the reference sample were observed. The peak of the graphite sample's locations irradiated with hydrogen and the sample irradiated with argon have been shifted to smaller angles. The displacement of the peaks in the proton-irradiated sample is higher than that of the argon ions. The argon ion and hydrogen ion beam specifications were calculated using the Lee code.

کلیدواژه‌ها [English]

  • Plasma Focus
  • Radiation Damage
  • Graphite
  • Material Analysis
  • Hydrogen/Argon Ions
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